Description of Individual Course Units
Course Unit CodeCourse Unit TitleType of Course UnitYear of StudySemesterNumber of ECTS Credits
9103065602004Surface Characterisation TechniquesElective128
Level of Course Unit
Second Cycle
Objectives of the Course
The aim of this course is to introduce the fundemental micro/nano structural material and surface characterization techniques.
Name of Lecturer(s)
Assoc. Prof. Ibrahim Etem SAKLAKOGLU
Learning Outcomes
11. Understand the basics of compositional surface analysis
22. Understand the basics of surface characterization and surface tension by contact angle measurement
34. Understand the basics of probe techniques
47. Understand the basics of absorption and resonance absorption spectroscopies
55. Understand the basics of ıon beam techniques
63. Understand the basics of basic principles of light and electron microscopy
76. Understand the basics of vibrational spectroscopies
88. Understand the basics of electrochemical techniques
Mode of Delivery
Face to Face
Prerequisites and co-requisities
None
Recommended Optional Programme Components
None
Course Contents
Fundamental Principles of interaction of electrons, ions and photons with materials, Basics of Instrumentation, Introduction of tools used to image and probe optical, electronic, chemical, and mechanical properties at the nanoscale,
Weekly Detailed Course Contents
WeekTheoreticalPracticeLaboratory
1Fundamental Principles of interaction of electrons, ions and photons with materials, Basics of Instrumentation
2Introduction of tools used to image and probe optical, electronic, chemical, and mechanical properties at the nanoscale
3Compositional Surface Analysis: X-ray Photoelectron Spectroscopy (XPS), Secondary Ion Mass Spectroscopy (SIMS). Auger Electron Spectroscopy
4Surface Characterization and Surface Tension by Contact Angle Measurement
5Basic Principles of Light and Electron Microscopy
6Light Microscopy: Optical Microscopy, Fluorescence Microscopy, Confocal Microscopy
7Electron Microscopy: Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM)
8Probe Techniques: Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Scanning Near Field Optical Microscopy (SNOM)
9Ion Beam Techniques: Low Energy Ion Beam Spectroscopy (LEISS), Rutherford Backscattering Spectroscopy,
10Vibrational Spectroscopies: Infrared and Raman Spectroscopies
11Mid term
12Absorption and Resonance Absorption Spectroscopies: Nuclear Magnetic Resonance (NMR)
13Electrochemical Techniques: Voltammetric Techniques, AC Impedance Analysis
14Characterization Strategies, Problem Analysis, Evaluation of the Spatial Resolution and Detection Limits for Different Techniques
15Technique Selection, Modeling the Results, Data Analysis
16Final Exam
Recommended or Required Reading
• Vickerman J.C., Surface Analysis-The Principal Techniques, John Wiley and Sons,2004 • Alford, T.L., Feldman, F.C., Mayer, J.W., Fundamentals of Nanoscale Film Analysis, Springer, 2007 • Dinardo, N.J., Nanoscale Characterization of Surfaces and Interfaces. 2nd ed., Wiley-VCH. 2004. • Golstein, J., Scanning Electron Microscopy and X-Ram Microanalysis. 3rd ed., Springer, 2003. • Watts, J.F., An Introduction to Surface Analysis by XPS and AES, Wiler 2003. • Wang, Z.L., Characterization of Nanophase Materials. Wiley-VCH, 2000. • Weinheim, E.L., X-ray characterization of materials, Wiley-VCH, 1999.
Planned Learning Activities and Teaching Methods
Activities are given in detail in the section of "Assessment Methods and Criteria" and "Workload Calculation"
Assessment Methods and Criteria
Term (or Year) Learning ActivitiesQuantityWeight
SUM0
End Of Term (or Year) Learning ActivitiesQuantityWeight
SUM0
SUM0
Language of Instruction
Turkish
Work Placement(s)
None
Workload Calculation
ActivitiesNumberTime (hours)Total Work Load (hours)
Midterm Examination122
Final Examination122
Attending Lectures14456
Self Study149126
Individual Study for Mid term Examination12525
Individual Study for Final Examination13030
TOTAL WORKLOAD (hours)241
Contribution of Learning Outcomes to Programme Outcomes
PO
1
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2
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3
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4
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5
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6
PO
7
PO
8
PO
9
PO
10
PO
11
PO
12
PO
13
PO
14
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LO8              
* Contribution Level : 1 Very low 2 Low 3 Medium 4 High 5 Very High
 
Ege University, Bornova - İzmir / TURKEY • Phone: +90 232 311 10 10 • e-mail: intrec@mail.ege.edu.tr